This website uses cookies to make the content more user-friendly and effective. By using this website, you agree to the use of cookies. You can find additonal information about the use of cookies and the possibility of objecting to the use of cookies here.

Log in
- Log in
  - Log in
    
    You can log-in here to save your settings in the supporting programme and the TicketShop.
    
    E-Mail *: Password *:
    
    Forgotten your password?
  - Forget / Request password?
    
    Please enter your email address, so that we can send you a password link.
    
    A new password has been sent to your registered e-mail address. Sending the e-mail may take several minutes.Please change your password immediately after logging in.
    
    E-Mail could not be sent.
- Register
  - Register
    
    You can register an account here to save your settings in the supporting programme and the TicketShop.
    
    E-Mail *: Password *: Repeat password *:
    
    I consent to the storage of my data in accordance with thedata protection.
    
    * Compulsory fields you must fill in.
Your Favourites (0)
- Lectures & Events (0)
Contact

Programme

back to day overview

Characterization of Particles

Nanofocused X-ray tomography & Image Processing for Quantitative Analysis of Pharmaceutical Particulate Solid Products

--- Date: 11.04.2019 Time: 2:40 PM - 3:00 PM Location: Hall Seoul, NCC Ost

Main speaker

Frederik J.S. Doerr

top